Pattern fabrication method using a charged particle beam and apparatus for realizing same

ABSTRACT

The present application relates to a method and an apparatus for forming a pattern, in which a plane on which a pattern on a sample is traced is decomposed into predetermined partial regions; the pattern density in each of the partial regions is stored in data storing means as pattern density map data; and the irradiation energy amount of a charged particle beam is corrected on the basis of the pattern density map data to correct shortage and excess in the exposure dose due to roughness and fineness of the pattern, i.e. the proximity effect. Further, the present application relates to a method and an apparatus for forming a pattern, in which, when one or a plurality of layers located under the layer on which the pattern should be formed have patterns, influences of the underlayers on the proximity effect are taken into account.

This is a continuation of application Ser. No. 647,562 filed on Jan. 29, 1991.

BACKGROUND OF THE INVENTION

The present invention relates to a pattern fabrication method using a charged particle beam and an apparatus for realizing the same, and in particular it provides a pattern fabrication method and a device for realizing the same suitable for fabricating semiconductor integrated circuits having an extremely high degree of integration.

The circuit pattern for semiconductor integrated circuits has become finer and finer without interruption and tracing by using a charged particle beam having a high resolving power has been used for forming the fine pattern. Even by using a charged particle beam having a high resolving power, when the pattern becomes further finer, a phenomenon takes place that an interval between two parts close to each other in a large figure is further narrowed, which gives rise to a problem in the formation of fine patterns. This phenomenon is one of the most serious problems in the fine pattern exposure by means of a charged particle beam and it is known in general as the proximity effect. The cause of this phenomenon consists in that projected charged particles pass through a beam energy sensitive product (hereinbelow called resist) to enter a semiconductor substrate and that a part of charged particles scattered in the substrate, for example, returns again to the surface of the resist to expose it thereto. The effect of this reexposure is equivalent to a charged particle beam pattern faded in a large extent being projected again lightly thereon. As a result, since the exposure at a dense part in the pattern becomes an excessive exposure, this gives rise to the phenomenon that the interval is varied, as described above.

Heretofore, in order to reduce influences of this proximity effect, various contrivances have been made on the pattern to be exposed.

A first method therefor consists in that deformations in the pattern to be exposed due to the proximity effect are previously calculated and that modifications for compensating them are carried out previously on the pattern to be exposed. That is, since a small interval is further reduced in size by the proximity effect, as described previously, small interval parts are looked for previously in the exposure pattern data and the width of the figure is reduced by a suitable degree on both sides so that the small interval parts are enlarged. In this way, even if the small interval parts are further narrowed by the proximity effect, a figure having a desired size can be formed.

A second method therefor is a method by which the dose is varied at the exposure so that the proximity effect is compensated. As described previously, since the proximity effect is produced by the fact that a faded exposure pattern is reexposed, if the exposure is effected so that changing parts in the pattern are emphasized so as to compensate fading, a pattern similar to that obtained by performing a desired exposure can be formed as the result of the fading. For example, each of the figures are decomposed and only the contour portion is taken out, which is exposed for a longer time than the central portion. In this way, a pattern is exposed in which the high frequency component of the exposure pattern is emphasized, which cancels the effect of the low frequency component emphasis due to the fading, and exposure by which influences of the proximity effect are reduced in some degree can be effected.

Further, as a third method, there is known a method by which the irradiation dose with the charged particle beam is varied depending on the exposed area ratio per unit area, i.e. pattern density. Since the proximity effect is caused by excessive exposure, the irradiation time is shortened at the place where the exposed area ratio is high, and the irradiation time is lengthened at the place where the exposed area ratio is low. In order to execute this correcting method, an algorithm for a computer inputting data for the exposure in an electron beam exposure system is specifically designed. The idea of varying the exposure time depending on the exposed area ratio has been already disclosed also in JP-A 58-32420, 59-139625 and 61-284921 and thus it is known that this method is useful for correcting the proximity effect. Further refer to J. Vac. Sci. Technol. B3 (1), January/February, 1985, pp. 165-173, J. Vac. Sci. Technol. B7 (6), November/December, 1989, pp. 1524-1527, and J. Appl. Phys. 54 (6), June, 1983, pp. 3573-3581.

As described above, the proximity effect can be removed in the principle by pattern processing. However the number of exposure patterns for recent high density integrated circuits reaches such a tremendous value that it exceeds several millions in total. The processing of these patterns has reached an enormous amount and calculation for only one circuit pattern took from several tens to more than several hundreds of hours even with a super large scale computer. In addition, in the present situation, this calculation time increases rapidly with increasing degree of integration of the pattern and in realistic terms the execution thereof was difficult.

SUMMARY OF THE INVENTION

The object of the present invention is to solve radically such a problem on the calculation time for correcting the proximity effect and to make it possible in realistic terms to expose an extremely fine pattern by means of a charged particle beam exposure system.

In order to achieve the above object, according to the present invention, a plane, on which a pattern is exposed, is decomposed into predetermined partial regions; the density of the pattern in each of the partial regions is stored in data storing means as pattern density map data; the irradiation energy of a charged particle beam is corrected on the basis of the pattern density map data so that shortage and excess of the exposure dose due to roughness and fineness of the pattern, i.e. the proximity effect, is corrected.

The correction theory on the exposure dose of the beam on the basis of the map data described above will be explained below.

It is supposed that a photosensitive layer disposed on a substrate is irradiated with an electron beam as indicated in FIG. 1, in which I represents the amount of the irradiation energy of the electron beam; E1 the amount of stored energy in the photosensitive layer due to the incident electron beam; and E2 the amount of stored energy in the photosensitive layer due to scattered electrons returning from the substrate to the photosensitive layer. Further, the ratio of the amount of total energy of E2 to E1 for the same incident beam is defined as k₀.

At this time, supposing that each pattern to be exposed is extremely small and that the area density therein has a constant value p₀, since the amount of stored energy from the back scattering is p₀ ×E2 on average, the following equations are valid: ##EQU1## Consequently, at the real pattern exposure, the average {(1+p₀ ×k₀)×E1+p₀ ×k₀ ×E1}/2 of the stored energy at the place where there is a pattern and the place where there is no pattern may determine the exposure irradiation electron energy I so as to be in accordance with the optimum exposure level θ for developing the given photosensitive layer.

Although it is supposed here that the area density p₀ is a constant which doesn't depend on the position on the photosensitive layer, in practice p₀ is a function depending on the position. However, since the back scattering is hardly influenced by fine spatial variations, the thought described above (p₀ : constant) can be applied approximately as it is in a partial region even if the position varies. According to this thought, it can be understood that the real optimum irradiation energy amount I may be given by;

    I=I.sub.0 ×{1/(1+2×p.sub.0 ×k.sub.0)}    (2)

However, it is supposed that the electron beam irradiation energy amount I is proportional to E1. Further, I₀ means the optimum irradiation energy amount, when it is supposed that there is no back scattering. Still, the energy ratio k₀ and the optimum irradiation energy amount I₀ are parameters obtained previously by experiments, etc.

Consequently, if the pattern density p₀ is given for every partial region, the irradiation energy amount I with the electron beam suitable for exposing the pattern just as designed can be obtained for every partial region by correcting the proximity effect.

In the above, the method for correcting the proximity effect on the basis of the exposure pattern density has been described quantitatively. The present invention can be extended to a method by which a pattern is exposed while correcting not only influences of the density of the pattern in the course of the exposure, but also influences of the pattern in the underlayer which has been already exposed. Now the method for correcting the proximity effect taking the influences of the pattern in the underlayer into account will be described below. In the case where the pattern to be exposed is a semiconductor wafer pattern, in many cases the pattern in the underlayer has been already exposed on the substrate and several materials having properties different just as their patterns are different are deposited. In such a case, the ratio k of the back scattering can differ remarkably at the place where there is a pattern in the underlayer and at the place where there is none, and there are cases where it is impossible to realize any satisfactory correction by the correction described above for which k is constant. However, in such a case, the correction can be effected by executing a processing as described below.

The influences of the presence or absence of the pattern in the underlayer appears in the ratio k of the stored energies due to the back scattering described above. Denoting k for the place where there is no pattern in the underlayer by k₀ and k for the place where there exists a pattern in whole in the underlayer by k₁, k when the area density of the pattern in the underlayer is p₁ is given by a linear interpolation as follows:

    k=k.sub.0 +(k.sub.1 -k.sub.0)×p.sub.1                ( 3)

Substituting this k for k₀ in the equations of correction (1) and (2) and rearranging them, the following equation is obtained: ##EQU2## where p₀ represents the area density of the pattern to be exposed.

Since I₀, k₀ and k₁ in Eq. (4) are parameters obtained previously by experiments, etc., if the pattern densities p₁ and p₀ can be obtained for every partial region on the sample surface, the amount of the electron beam energy suitable for exposing a pattern as designed can be obtained for every relevant partial region while correcting the proximity effect and taking also the influences of the pattern in the underlayer into account.

Further, putting

    P=p.sub.0 ×{1+(k.sub.1 /k.sub.0 -1)×p.sub.1 }  (5)

in Eq. (4) and substituting this P for p₀ in Eq. (2), the optimum irradiation energy amount can be obtained, also in the case where there exists a pattern in the underlayer, in the same way as in the case where there is no pattern therein.

This idea can be extended also to the case where the underlayer is divided into a plurality of layers. That is, also in the case where the underlayer is composed of two layers, putting

P₁₀ for the pattern density at a place on the pattern in the first layer of the underlayer where there is no pattern in the second layer;

p₀₁ for the pattern density at a place on the pattern in the second layer of the underlayer where there is no pattern in the first layer;

p₁₁ for the pattern density at a place both on the pattern in the first layer and on the pattern in the second layer;

k₁₀ for the ratio of the exposure due to the back scattering at a place on the pattern in the first layer of the underlayer where there is no pattern in the second layer;

k₀₁ for the ratio of the exposure due to the back scattering at a place on the pattern in the second layer of the underlayer where there is no pattern in the first layer; and

k₁₁ for the ratio of the exposure due to the back scattering at a place both on the pattern in the first layer and on the pattern in the second layer; and

calculating a new area density p by using; ##EQU3## the correction can be effected by using this P completely in the same way as for the pattern in the first layer. Also in the case where the underlayer is divided into more than two layers, this method can be applied as well.

That is, even if the underlayer has some influences on the proximity effect, if exposure dose map data are formed for the underlayer and a pattern to be exposed is synthesized by using the exposure dose map data and Eqs. (5) and (6), the correction can be effected completely in the same manner as for the case where there are no influences of the underlayer.

In the above explanation, the area density of the pattern calculated from the pattern to be exposed was used for p₀ as it was. However, in practice, since the exposure due to the back scattering is extended to a relatively wide region, it is necessary to use values p₀ obtained by smoothing spatially the distribution of the area density of the pattern. In this case, since the domain of the back scattering varies depending on the material of the underlayer, the domain of the smoothing should be calculated differently depending on the material of the underlayer. For example, in the case where the underlayer is made of a material having a high reflection coefficient such as tungsten, the domain of the smoothing should be smaller than that usually used. For example, in Eq. (7) expressing a two-dimensional smoothing filter function: ##EQU4## l and m are in a domain from -3 to +3.

Further, in the case where the correction is effected taking influences of a plurality of layers into account, the pattern density P' which is to be substituted for p₀ in Eq. (2) can be obtained also from Eq. (8):

    P'(i,j)=b.sub.0 +b.sub.1 ×p.sub.1 (i,j)+b.sub.2 ×p.sub.2 (i,j)+b.sub.3 ×p.sub.1 (i,j)×p.sub.2 (i,j)    (8)

where a(l,m), b₀, b₁, b₂ and b₃ are arbitrary parameters.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a cross-sectional view showing the back scattering of an electron beam;

FIG. 2 is a block diagram indicating the whole construction of a pattern forming apparatus in an embodiment of the present invention;

FIG. 3 is a block diagram indicating the whole construction of the electron beam exposure system in the same embodiment;

FIG. 4 is a flow chart indicating the operation of the electron beam exposure system in the same embodiment;

FIG. 5 is a scheme showing a data storing device for storing pattern density map data and a device for correcting the irradiation time with an electron beam on the basis of the data in the same embodiment;

FIG. 6 is an enlarged plan view indicating partial regions and rectangles on the sample surface;

FIG. 7 is a scheme indicating addresses for the data storing device;

FIGS. 8A to 8G are schemes for explaining the effect of correcting the proximity effect in the present embodiment;

FIG. 9 is a scheme showing the construction of an electron beam exposure system of type in which a pattern is scanned with an electron beam to be exposed and to which the present invention can be applied; and

FIG. 10 is a flow chart indicating the operation of an electron beam exposure system which is another embodiment.

DESCRIPTION OF THE PREFERRED EMBODIMENTS

FIG. 2 shows the construction of a device for forming a pattern for a high density integrated circuit.

A pattern designed by means of a CAD device 100 is treated by a large scale computer 102 to obtain data for exposure. By the prior art technique the proximity effect was corrected by using a processing algorithm for the computer 102. In the present embodiment the large scale computer 102 is not provided with any special algorithm for correcting the relevant proximity effect. Exposure pattern data obtained by the large scale computer 102 are stored once in an auxiliary memory device 2.

FIG. 3 shows the whole construction of a variable forming type charged particle beam exposure system 110 and FIG. 4 is a flow chart of the operation thereof. Exposure pattern data 3 inputted from the auxiliary memory device 2 of a control computer 1 are stored once in a high speed buffer memory 4 (S1) and read out with a high speed at the exposure (S2). The pattern data thus read out are usually those subjected to a number of data compression processings. At first, the compressed data are restored to basic figure data sets independent from each other by a restoring circuit 5 (S3). Next each basic figure is decomposed into an assembly of rectangular data sets by a figure decomposing circuit 6, each rectangle being smaller than a specified size which can be exposed at one time (S4). The output from this figure decomposing circuit 6 consists of a signal T indicating the charged particle beam irradiation time, longitudinal and transversal sizes (H, W) of the rectangular figure, and positional coordinates (X, Y). In a prior art exposure system, the irradiation time T was inputted directly to an irradiation time generating circuit 7 to be transformed into a charged particle beam irradiation/non-irradiation timing signal 8; the longitudinal and transversal sizes (H, W) were inputted directly to a DA converter 9 to be transformed into an analogue deflection signal 10 for forming the cross-section of the charged particle beam, further the positional coordinates (X, Y) were inputted directly to a DA converter 11 to be transformed into an analogue signal 12 for the positional deflection, all of them being used for the control of the exposure in the body tube portion 13 of the charged particle beam generator.

That is, an exposure control circuit 112 of the variable forming type charged particle beam exposure system 110 is constructed so as to output the position (X, Y) of the rectangular figure, the longitudinal and transversal sizes (W, H) of the rectangular figure and the duration T during which the pattern is irradiated with charged particles as control data, every time a rectangular figure is exposed. According to the present invention, the electron beam can have the optimum irradiation energy amount owing to a proximity effect correcting circuit 14 and a data storing device 106 newly added after the figure decomposing circuit 6 as indicated in the figure.

Next, the content of the processing of the proximity effect correcting circuit 14 and the data storing device will be explained more in detail.

At first, the formation of pattern density map data for the layer irradiated with the electron beam and the storage thereof will be explained, referring to FIGS. 5 to 7. That is, in the present embodiment the case where the influences of the pattern in the layer under the relevant layer irradiated with the electron beam can be neglected will be explained. The pattern density to be obtained is p₀ in Eq. (2) described above. FIG. 5 shows a device 120 for writing the pattern density map data in the data storing device 106. Further, in order to make the following explanation understandable, it is supposed that the positional coordinates X and Y on the sample surface range from 0 to 1023 as indicated in FIG. 6, i.e. each of the coordinates X and Y has 12 bits. Now, when a numerical value 21 of 8 bits, in which the most significant 4 bits are the most significant 4 bits of Y and the least significant 4 bits are the most significant 4 bits of X, represents an address input in the data storing device 106 through a selecting circuit 22, a partial region, for which Y is between 0 and 63 and X is between 0 and 63, corresponds to address 0 in the data storing device 106 and another partial region, for which Y is between 0 and 63 and X is between 64 and 127, corresponds to address 1. In this way each of the partial regions produced by dividing the whole region by 64×64 corresponds to a predetermined address in the data storing device 106 (refer to FIG. 7).

For one of the rectangles 130 to be exposed, obtained by dividing the whole region by means of the figure decomposing circuit 6, the area W×H (cross-section of the beam) is calculated by a multiplier 24. Then the value of the area is stored at the address in the data storing device 106 corresponding to the partial region containing the coordinates X and Y of the rectangle 130 through a selecting circuit 28. In the case where there exist a plurality of rectangles 130 in one partial region, the total area of them is stored at the corresponding address in the data storing device 106. This operation is executed by adding area data of a rectangle newly read-in to the area data at the relevant corresponding address by means of an adder 26. When such an operation is executed for all the rectangles to be exposed, data of the total sum of the areas to be exposed are stored for every partial region on the sample surface and thus the pattern density is obtained for every partial region.

In the above description it is supposed that "0" is written-in for all the contents of the data storing device 106 before exposing. Strictly speaking, since data of one rectangle may extend over a plurality of partial regions (refer to partial regions Nos. 5 and 6 in FIG. 6), it is impossible to calculate precisely the pattern density by this method. However, usually, since the size of the rectangles to be exposed is sufficiently small with respect to the size of the partial regions, the difference therebetween can be neglected.

Furthermore, it is possible also to smooth the pattern density map data described above. That is, the calculated numerical value for each of the partial regions is smoothed by using numerical values of partial regions in the neighborhood thereof to calculate a macroscopic exposure dose distribution. In one example of a suitable method, the numerical value of each of the partial regions is replaced by the arithmetic average of the numerical values of 5×5 partial regions around the relevant partial region. That is, it is supposed that l, m=-2 to +2 in Eq. (7). In this case, the calculation is effected, assuming that the exposure dose is 0 for the partial regions outside of the pattern region. Such a calculation can be satisfactorily executed merely by adding a usual calculating circuit 29 to the data storing device 106, because the contents of the data storing device 106 are merely read out therefrom, averaged and written-in again therein (refer to FIG. 5). This can be realized by inputting an address signal 30 corresponding to a desired partial region from the calculating circuit 29 to the data storing device 106 through the selecting circuit 22; effecting smoothing calculation by using the output p₀ of the data storing device 106 at that time; and writing-in again the result thus obtained in the data storing device through the selecting circuit 28. It is a matter of course that no calculating circuit exclusively used therefor is added, but the content of the data storing device may be read in to the control computer of the exposure system and the result thus obtained may be written again in the data storing device after the calculation.

The operation described above is effected prior to the exposure of one pattern and the map data which have been once stored are repeatedly used as far as a same pattern is exposed.

On the other hand, the energy ratio k₀ and the optimum irradiation energy amount I₀, when it is supposed that there is no back scattering, are obtained experimentally, corresponding to each of the patterns.

In the present embodiment, in view of the fact that the irradiation energy amount per unit cross-section and per unit time is constant, the real optimum irradiation energy amount I obtained by using Eq. (2) is proportional to the irradiation time T, and irradiation time is adjusted by varying the irradiation time with the electron beam. That is, the optimum irradiation time T' in practice for suppressing the influences of the proximity effect is given by;

    T'=T.sub.0 ×{1/(1+2×p.sub.0 ×k.sub.0)}   (2)'

where T₀ is the irradiation time corresponding to the optimum irradiation energy amount I₀, when it is supposed that there is no back scattering. The time T₀ is given as an irradiation time data of the rectangular data outputted from the figure decomposing circuit 6.

Now the method for correcting the irradiation time T₀, by which the pattern is exposed so that the proximity effect is corrected by using the data map of the pattern density p₀ described above and k₀, will be explained, while referring to FIG. 4.

The pattern density p₀ (which is smoothed) in the partial region containing the positional coordinates of the rectangular data to be really exposed is read out from the data storing device 106 (Step 5). In Step 6, on the basis of the information on the pattern density p₀ the transforming circuit 32 reads out the corresponding energy ratio k₀ from the memory 109 and executes an operation

    {1/(1+2×p.sub.0 ×k.sub.0)}=l                   (9)

in Eq. (2)' to output the correction coefficient l to the multiplier 33. Another transforming circuit can be connected to the data storing device 106 so that the coefficient l as to the all density p₀ calculated with the predetermined ratio k₀ by using the transforming circuit are also stored in the data storing device 106. And the correction coefficient l is read out from the device 106 corresponding to the density p₀ of the rectangular data to be really exposed. The multiplier 33 multiplies To by the relevant correction coefficient l to calculate the optimum irradiation time T'.

Although, in the above description, explanation was made for the case where the irradiation time with the electron beam is corrected on the basis of Eq. (2)', if 2×p₀ ×k₀ <<1, Eq. (9) approximates a linear equation including the density p₀ so that the irradiation time can be calculated by using addition and subtraction. In this case an adder-subtracter is used in lieu of the multiplier 33.

Further, in order to smooth variations in the exposure dose, it is possible also to obtain the pattern density p₀ at the position of each of the figures by linear interpolation using the pattern density in the partial regions in the neighborhood thereof, assuming that the value of each of the partial regions can be represented by the value at the central position of the relevant partial region. In this way the correction of the proximity effect can be effected further finely. Also in this case, although the circuit is more complicated than that used in the embodiment described above, this can be carried out easily by the usual circuit technique. The exposure is effected by the usual method for all the partial regions (S7, S8).

Next the effect of the present embodiment will be explained specifically, referring to FIGS. 8A-8G. FIG. 8A shows a figure pattern to be exposed. It is supposed that the figure to be exposed consists of one narrow elongated figure on the left side and five figures identical thereto from the central portion to the right side. Now, when variations in the exposure dose of the charged particle beam for exposing them are indicated along the line a--a', if there were no reexposure due to scattering from the interior of the substrate, they would be ideally exposed in an extent of the fading of the charged particle beam, as indicated in FIG. 8B, when they are exposed only uniformly. Consequently, when they are developed at an exposure level θ, the figure should be able to be formed in a desired shape. However, in reality, since there is reexposure due to scattering from the interior of the substrate, excessive exposure takes place where the exposed area is large, as indicated in FIG. 8C. In this case, if the development were effected at the exposure level θ, a faded figure as indicated in FIG. 8D would be formed and it would be difficult to form a fine figure any more. This is the phenomenon called proximity effect. According to the present invention, in order to correct this proximity effect, at first a region to be exposed is divided into a plurality of partial regions and the area to be exposed in each of the partial regions is calculated. The result thus obtained is smoothed. In this way it is possible to obtain a waveform representing an approximate variation in the exposure dose, as indicated in FIG. 8. Therefore, when the exposure is effected so that the exposure dose is decreased where this waveform is high and it is increased where this waveform is low, a waveform as indicated in FIG. 8F as the real exposure dose can be obtained. If the exposure dose varies as indicated in FIG. 8F, when the development is effected at the exposure level θ, it is possible to form a figure pattern having an almost desired line width, as indicated in FIG. 8G. As described above, when the present invention executed in practice, it is possible to form a desired fine figure, decreasing the influences of the proximity effect.

Although, in the present embodiment, only a variable forming type charged particle beam exposure system using a beam having a rectangular cross-section has been discussed, even with a charged particle beam having an arbitrary polygonal cross-section such as triangular, L-shaped, etc., since the exposure system includes a numerical signal controlling the shape, it is possible to calculate the cross-sectional area by means of a calculating circuit and thus to carry out easily the present invention. Even with an exposure system having a function of selecting an aperture for variable forming having the shape of a specified circuit pattern to be able to expose repeatedly the pattern, since the exposed area of the specified pattern is previously known, the present embodiment can be applied as well by using the area as a parameter and by accumulatively adding it.

On the whole construction of the electron beam exposure system used in the embodiment described above, refer to, for example, "Variable Spot Shaping for Electron-beam Lithography" H. C. Pfeiffer, Fourteenth Symposium on Electron, Ion, And Photon, Beam Technology, 1978, pp 887-890. For the charged particle beam an ion beam, etc., can be used.

Further, even with an exposure system in which a sample surface 152 is scanned with a charged particle beam 150 having a punctual or formed cross-section to expose a rectangle 130, as indicated in FIG. 9, if the scanning distance is considered to be sectioned, it is possible to calculate the exposed cross-sectional area equivalent thereto. However, in this case, the regulation of the exposure dose can be effected by varying the cross-section of the charged particle beam or the scanning speed, depending on the area to be exposed.

In FIG. 9, reference numeral 154 in the figure represents deflecting plates 154 and reference numerals 156, 157 and 158 are a counter, a digital-analogue converter and an amplifier, respectively, for controlling the deflecting plates.

The embodiment explained below is applied to the case where a pattern on a layer (hereinbelow called "underlayer") located under the layer (hereinbelow called "pattern forming layer"), on which a pattern is to be formed, has influences on the proximity effect. That is, it is an example where Eqs. (4) and (5) are applied.

At first, the pattern densities p₀ and p₁ on the pattern forming layer and the underlayer, respectively, are stored in the data storing device 106 in the form of map data in the same way as in the preceding embodiment (refer to FIG. 5). On the other hand the energy ratios k₀ and k₁ are stored in the memory 109. The optimum irradiation time T₀ in the case where the influences of the underlayer can be neglected is obtained in the same way as in the preceding embodiment.

The operation in the present embodiment will be explained, referring to the flowchart indicated in FIG. 10. The steps in the flowchart indicated in FIG. 10, in which the same operations as those in the flowchart indicated in FIG. 4 are performed, are referred to by the same reference numerals and explanation thereof will be partly omitted. That is, the steps characterizing the present embodiment are S100 to S500.

In Step 100, the pattern density p_(o) (not smoothed) in the partial region on the pattern forming layer including positional coordinates of the rectangular data, which are really to be exposed, is read out from the data storing device 106. In Step 200, the pattern density p₀ read out in Step 100 is smoothed on the basis of Eq. (7) and the pattern density p₀ thus obtained is stored again in the data storing device 106.

In Step 300, the pattern density p₁ of the partial region in the underlayer including the same positional coordinates as the positional coordinates of the rectangular data, which are to be exposed, is read out from the data storing device 106. Then, in Step 400, the pattern density p₁ is smoothed on the basis of Eq. (7) and the average pattern density p₁ thus obtained is stored again in the data storing device 106.

In step 500, the transforming circuit 32 reads out p₀ and p₁ from the data storing device 106 and k₀ and k₁ from the memory 109. The operation in [ ] in Eq. (4) is executed and the correction coefficient l is outputted to the multiplier 33. Then the multiplier 33 multiplies To by the relevant correction coefficient l and calculates the optimum irradiation time T'.

Further, in order to increase the calculation speed in Step 500, it is desired to execute the operation in Eq. (5) and to store the value of P thus obtained in the data storing device 106. In this case, a circuit for executing the operation in Eq. (5) is added to the data storing device 106 and a memory for storing the parameters k₀ and k₁ is connected with the circuit stated above. Furthermore, since Eq. (2)' is calculated in the transforming circuit 32, only k₀ is stored in the memory 109.

In addition, in Step 500, it is possible also to execute the operation in Eq. (8) in the same way as described above and to store the value of P' thus obtained in the data storing device.

Furthermore, in the present specification the following items will be disclosed in addition to the embodiment described above. It is a matter of course that the technical scope of the present invention is not limited to these descriptions, but covers also the scope, which those skilled in the art can consider easily.

Although the above embodiments are so constructed that the data storing device is added to the proximity effect correcting device of the electron beam exposure system, the proximity effect correcting circuit can be disposed also between the electron beam exposure system and a large scale computer in the form of a separate device. Further the correcting circuit can have the operation executed by the large scale computer.

In the theory for correcting the irradiation energy amount with an electron beam, which has been already described and Eqs. (1) to (6) based on the theory, the data serving as the foundation of the correction were the density of the area of the pattern.

However, even for a same area density, the back scattered energy amount varies too, depending on the length of the irradiation time with the beam. Consequently it is preferable to multiply p₀, p₁, etc. in different equations by a time parameter.

Specifically, in the step of forming the pattern density in the different partial region, in lieu of adding accumulatively the area (W×H) of the rectangular data, area×irradiation time (W×H×T) is added accumulatively. A data map is formed by using it as the exposure dose in each of the partial regions. How to use this exposure dose data map has been already explained in the different embodiments described previously.

The calculation of the exposure dose for each of the partial regions may be done only once, when new exposure pattern data are set. If there is disposed means for storing that value as data annexed to the exposure pattern data, it can be read out to be used for the exposure of a same pattern as many times as desired. This is a processing of at most about several minutes, as described previously, for the control circuit in the exposure system. Consequently, if the present invention is carried out, the proximity effect correcting calculation of several tens to several hundreds of hours by means of the large scale computer described above can be omitted only by effecting a preliminary processing of several minutes by means of the exposure system. Therefore the present invention has an extremely high practical value. 

We claim:
 1. An apparatus for exposing a plurality of pattern areas forming a pattern on a surface of a sample using a charged particle beam, comprising:means for emitting charged particles; means for accelerating and focusing the charged particles to form a charged particle beam; means for deflecting the charged particle beam across the surface of the sample to irradiate respective areas of the surface of the sample where the pattern areas are to be exposed, thereby exposing the pattern areas on the surface of the sample; means for generating respective irradiation doses of the charged particle beam for the pattern areas substantially at the same time the charged particle beam irradiates the respective areas of the surface of the sample, the respective irradiation doses being effective to suppress an influence on the exposed pattern areas caused by a proximity effect occurring as a result of the irradiation of the surface of the sample by the charged particle beam; and means for controlling an irradiation dose of the charged particle beam in accordance with the respective irradiation doses as the charged particle beam irradiates the respective areas of the surface of the sample, thereby exposing the pattern areas on the surface of the sample such that the influence caused by the proximity effect is suppressed on the exposed pattern areas.
 2. An apparatus according to claim 1, wherein the proximity effect is due to back scattering in the sample occurring as a result of the irradiation of the surface of the sample by the charged particle beam, and wherein the irradiation dose generating means generates the respective irradiation doses based on an influence of the back scattering on the exposed pattern areas.
 3. An apparatus according to claim 2, further comprising means for generating a parameter representative of the influence of the back scattering on the exposed pattern areas, wherein the irradiation dose generating means generates the respective irradiation doses based on the parameter.
 4. An apparatus according to claim 3, wherein the influence of the back scattering on the exposed pattern areas depends on a material of the sample, and wherein the parameter generating means generates the parameter based on the material of the sample.
 5. An apparatus according to claim 2, further comprising means for inputting a parameter representative of the influence of the back scattering on the exposed pattern areas to the irradiation dose generating means, wherein the irradiation dose generating means generates the respective irradiation doses based on the parameter.
 6. An apparatus according to claim 2, further comprising means for storing a parameter representative of the influence of the back scattering on the exposed pattern areas, wherein the irradiation dose generating means reads out the parameter stored in the parameter storing means and generates the respective irradiation doses based on the parameter.
 7. An apparatus according to claim 1, wherein the irradiation dose generating means includes means for smoothing the respective irradiation dose for each pattern area of the pattern areas based on at least one of the respective irradiation doses for at least one of the pattern areas which is adjacent to said each pattern area.
 8. An apparatus according to claim 7, further comprising means for inputting a parameter specifying an area of the pattern over which the respective irradiation dose for said each pattern is to be smoothed to the smoothing means, wherein the smoothing means smoothes the respective irradiation dose for said each pattern based on the parameter.
 9. An apparatus according to claim 8, wherein the parameter depends on a material of the sample.
 10. An apparatus according to claim 1, wherein the irradiation dose generating means generates the respective irradiation doses by modulating a constant basic irradiation dose based on respective positions in the pattern of substantially all of the pattern areas and respective cross-sectional shapes of substantially all of the pattern areas.
 11. An apparatus according to claim 10, wherein the irradiation dose generating means includes means for generating pattern density map data based on respective positions in the pattern of substantially all of the pattern areas and respective cross-sectional shapes of substantially all of the pattern areas, means for storing the pattern density map data, and means for modulating the constant basic irradiation dose based on the stored pattern density map data.
 12. An apparatus for exposing a plurality of pattern areas forming a pattern on a surface of a sample using a charged particle beam, comprising:means for emitting charged particles; means for accelerating and focusing the charged particles to form a charged particle beam; means for deflecting the charged particle beam across the surface of the sample to irradiate respective areas of the surface of the sample where the pattern areas are to be exposed, thereby exposing the pattern areas on the surface of the sample; means for generating respective irradiation doses of the charged particle beam for the pattern areas substantially immediately prior to the time the charged particle beam irradiates the respective areas of the surface of the sample, the respective irradiation doses being effective to suppress an influence on the exposed pattern areas caused by a proximity effect occurring as a result of the irradiation of the surface of the sample by the charged particle beam; and means for controlling an irradiation dose of the charged particle beam in accordance with the respective irradiation doses as the charged particle beam irradiates the respective areas of the surface of the sample, thereby exposing the pattern areas on the surface of the sample such that the influence caused by the proximity effect is suppressed on the exposed pattern areas.
 13. An apparatus for exposing a plurality of pattern areas forming a pattern on a surface of a sample using a charged particle beam, comprising:means for emitting charged particles; means for accelerating and focusing the charged particles to form a charged particle beam; means for generating first data defining positions and shapes of substantially all of the pattern areas; means for generating second data defining respective positions and respective cross-sectional shapes of irradiation units of the charged particle beam in substantially all of the pattern areas based on the first data, each of the pattern areas corresponding to at least one of the irradiation units, the second data not being related to an irradiation dose of the charged particle beam; means for generating a constant basic irradiation dose of an irradiation unit of the charged particle beam; means for deflecting the charged particle beam across the surface of the sample to irradiate respective areas of the surface of the sample where the pattern areas are to be exposed based on the second data, thereby exposing the pattern areas on the surface of the sample; and means for generating respective corrected irradiation doses of the irradiation units in the pattern areas by correcting the constant basic irradiation dose of each of the irradiation units in the pattern areas based on the second data while the charged particle beam irradiates the respective areas on the surface of the sample to suppress an influence on the exposed pattern areas caused by a proximity effect occurring as a result of the irradiation of the surface of the sample by the charged particle beam.
 14. An apparatus according to claim 13, wherein the corrected irradiation dose generating means includes means for generating pattern density map data based on the second data, and means for generating the respective corrected irradiation doses of the irradiation units in the pattern areas based on the pattern density map data.
 15. An apparatus for exposing a plurality of pattern areas forming a pattern on a surface of a sample using a charged particle beam, comprising:means for emitting charged particles; means for accelerating and focusing the charged particles to form a charged particle beam; means for deflecting the charged particle beam across the surface of the sample to irradiate respective areas of the surface of the sample where the pattern areas are to be exposed, thereby exposing the pattern areas on the surface of the sample; means for calculating respective irradiation doses of irradiation units of the charged particle beam in the pattern areas, each of the pattern areas corresponding to at least one of the irradiation units; and means for controlling the deflecting means to irradiate the surface of the sample with one of the irradiation units of the charged particle beam, for subsequently controlling the calculating means to calculate an irradiation dose of a subsequent irradiation unit of the charged particle beam, and for subsequently controlling the deflecting means to irradiate the surface of the sample with the subsequent irradiation unit while controlling an irradiation dose of the subsequent irradiation unit in accordance with the calculated irradiation dose of the subsequent irradiation unit.
 16. A method of exposing a plurality of pattern areas forming a pattern on a surface of a sample using a charged particle beam, comprising the steps of:emitting charged particles; accelerating and focusing the charged particles to form a charged particle beam; deflecting the charged particle beam across the surface of the sample to irradiate respective areas of the surface of the sample where the pattern areas are to be exposed, thereby exposing the pattern areas on the surface of the sample; generating respective irradiation doses of the charged particle beam for the pattern areas substantially at the same time the charged particle beam irradiates the respective areas of the surface of the sample, the respective irradiation doses being effective to suppress an influence on the exposed pattern areas caused by a proximity effect occurring as a result of the irradiation of the surface of the sample by the charged particle beam; and controlling an irradiation dose of the charged particle beam in accordance with the respective irradiation doses as the charged particle beam irradiates the respective areas of the surface of the sample, thereby exposing the pattern areas on the surface of the sample such that the influence caused by the proximity effect is suppressed on the exposed pattern areas.
 17. A method according to claim 16, wherein the step of generating the respective irradiation doses includes the step of modulating a constant basic irradiation dose based on respective positions in the pattern of substantially all of the pattern areas and respective cross-sectional shapes of substantially all of the pattern areas.
 18. A method of exposing a plurality of pattern areas forming a pattern on a surface of a sample using a charged particle beam, comprising the steps of:emitting charged particles; accelerating and focusing the charged particles to form a charged particle beam; deflecting the charged particle beam across the surface of the sample to irradiate respective areas of the surface of the sample where the pattern areas are to be exposed, thereby exposing the pattern areas on the surface of the sample; generating respective irradiation doses of the charged particle beam for the pattern areas substantially immediately prior to the time the charged particle beam irradiates the respective areas of the surface of the sample, the respective irradiation doses being effective to suppress an influence on the exposed pattern areas caused by a proximity effect occurring as a result of the irradiation of the surface of the sample by the charged particle beam; and controlling an irradiation dose of the charged particle beam in accordance with the respective irradiation doses as the charged particle beam irradiates the respective areas of the surface of the sample, thereby exposing the pattern areas on the surface of the sample such that the influence caused by the proximity effect is suppressed on the exposed pattern areas.
 19. A method of exposing a plurality of pattern areas forming a pattern on a surface of a sample using a charged particle beam, comprising the steps of:emitting charged particles; accelerating and focusing the charged particles to form a charged particle beam; generating first data defining positions and shapes of substantially all of the pattern areas; generating second data defining respective positions and respective cross-sectional shapes of irradiation units of the charged particle beam in substantially all of the pattern areas based on the first data, each of the pattern areas corresponding to at least one of the irradiation units, the second data not being related to an irradiation dose of the charged particle beam; generating a constant basic irradiation dose of an irradiation unit of the charged particle beam; deflecting the charged particle beam across the surface of the sample to irradiate respective areas of the surface of the sample where the pattern areas are to be exposed based on the second data, thereby exposing the pattern areas on the surface of the sample; and generating respective corrected irradiation doses of the irradiation units in the pattern areas by correcting the constant basic irradiation dose of each of the irradiation units in the pattern areas based on the second data while the charged particle beam irradiates the respective areas of the surface of the sample to suppress an influence on the exposed pattern areas caused by a proximity effect occurring as a result of the irradiation of the surface of the sample by the charged particle beam.
 20. A method of exposing a plurality of pattern areas forming a pattern on a surface of a sample using a charged particle beam, comprising the steps of:emitting charged particles; accelerating and focusing the charged particles to form a charged particle beam; deflecting the charged particle beam across the surface of the sample to irradiate the surface of the sample with an irradiation unit of the charged particle beam, each of the pattern areas corresponding to at least one irradiation unit of the charged particle beam; subsequently calculating an irradiation dose of a subsequent irradiation unit of the charged particle beam; and subsequently deflecting the charged particle beam across the surface of the sample to irradiate the surface of the sample with the subsequent irradiation unit while controlling an irradiation dose of the subsequent irradiation unit in accordance with the calculated irradiation dose of the subsequent irradiation unit.
 21. An apparatus for exposing a plurality of pattern areas forming a pattern on a surface of a sample using a charged particle beam, comprising:means for emitting charged particles; means for accelerating and focusing the charged particles to form a charged particle beam; means for deflecting the charged particle beam across the surface of the sample to irradiate respective areas of the surface of the sample where the pattern areas are to be exposed, thereby exposing the pattern areas on the surface of the sample; and means for generating respective irradiation doses of the charged particle beam for the pattern areas substantially at the same time the charged particle beam irradiates the respective areas of the surface of the sample, the respective irradiation doses being effective to suppress an influence on the exposed pattern areas caused by a proximity effect occurring as a result of the irradiation of the surface of the sample by the charged particle beam.
 22. An apparatus for exposing a plurality of pattern areas forming a pattern on a surface of a sample using a charged particle beam, comprising:means for emitting charged particles; means for accelerating and focusing the charged particles to form a charged particle beam; means for deflecting the charged particle beam across the surface of the sample to irradiate respective areas of the surface of the sample where the pattern areas are to be exposed, thereby exposing the pattern areas on the surface of the sample; and means for generating respective irradiation doses of the charged particle beam for the pattern areas substantially immediately prior to the time the charged particle beam irradiates the respective areas of the surface of the sample, the respective irradiation doses being effective to suppress an influence on the exposed pattern areas caused by a proximity effect occurring as a result of the irradiation of the surface of the sample by the charged particle beam.
 23. A method of exposing a plurality of pattern areas forming a pattern on a surface of a sample using a charged particle beam, comprising the steps of:emitting charged particles; accelerating and focusing the charged particles to form a charged particle beam; deflecting the charged particle beam across the surface of the sample to irradiate respective areas of the surface of the sample where the pattern areas are to be exposed, thereby exposing the pattern areas on the surface of the sample; and generating respective irradiation doses of the charged particle beam for the pattern areas substantially at the same time the charged particle beam irradiates the respective areas of the surface of the sample, the respective irradiation doses being effective to suppress an influence on the exposed pattern areas caused by a proximity effect occurring as a result of the irradiation of the surface of the sample by the charged particle beam.
 24. A method of exposing a plurality of pattern areas forming a pattern on a surface of a sample using a charged particle beam, comprising the steps of:emitting charged particles; accelerating and focusing the charged particles to form a charged particle beam; deflecting the charged particle beam across the surface of the sample to irradiate respective areas of the surface of the sample where the pattern areas are to be exposed, thereby exposing the pattern areas on the surface of the sample; and generating respective irradiation doses of the charged particle beam for the pattern areas substantially immediately prior to the time the charged particle beam irradiates the respective areas of the surface of the sample, the respective irradiation doses being effective to suppress an influence on the exposed pattern areas caused by a proximity effect occurring as a result of the irradiation of the surface of the sample by the charged particle beam. 